With rapid development in 5G, AIOT, automotive electronics, and other downstream sectors, the entire supply chain is expected to benefit from this consumer market. As product demand momentum gradually increases, increasing production efficiency and reducing operational costs become the most important issues. In order to meet the needs of customers for various packaging types, Yingwei Technology has been committed to developing highly customized test seats. However, a resulting pain point is the inability to mass-produce and fully automate operations with machines; some tasks still rely on manual execution. In this project, the probe part of the test seat was outsourced in 2021, and under current and future large-scale demands, work hours, costs, supply, and quality are issues Yingwei faces.
The company achieves a defect detection rate of 99.95%, which seems high, but with an average inspector able to inspect 10,000 needles per day, there would still be 5 defective needles. On a test seat that is only 3 cm wide with approximately 1,000 needles, just one defective needle could potentially lead to faulty testing at the customer end. As the current operational mode relies on manual visual inspection, external factors such as fatigue or oversight of personnel, and subjective judgment by inspectors may lead to the outflow of defective products, which necessitates strict quality control of contact components.
We once sought to utilize optical inspections (Rule-based) for controlling the quality of appearances, but the metallic material of the contact components leads to light scattering, background noise interference, background scratches, and material issues that could result in misjudgments. Therefore, we decided to look for AI technology service providers to solve our detection difficulties.
Developments of Dedicated AOI Line Scan Equipment
To meet the needs for inspecting thousands to tens of thousands of probes within our company's IC test seats, traditional surface imaging and individual needle imaging would be too slow to achieve rapid inspection and labor-saving goals. In response, the service provider proposed a trial with an AOI dedicated line scan module solution. Utilizing a width of 6.3mm on the X-axis for reciprocal scanning of all probes on the test seat, the tests allowed for the simultaneous scanning of 8-9 probes, significantly enhancing the future detection efficiency of AOI machines. This project will proceed with the aforementioned innovative Proof of Concept (POC), focusing on the development of the line scanning equipment and performing imaging, learning, and training on both normal and abnormal probes provided by our company, with initial AI model training aimed at preliminary approval.
This project's customized line-scan imaging moduleIdeal future imaging result illustration
A Single AI Technology Solution for Measurement/Detection Needs
Unified use of AI DL CNN learning methods, instead of the current Rule-based system which necessitates defining each defect individually, to meet the needs for abrasion measurement and appearance defect detection of malfunctions/foreign objects. When the same machine uses both measurement and detection technologies, not only does it increase costs, but it also affects the detection speed. Hence, the service provider recommends the use of a line scan device for imaging. Its resolution is sufficient for AI to simultaneously determine appearance defects and assess the condition of needle tip abrasion, as detailed below.
Line scan pixel imaging displaying needle tip abrasion conditions
This AI detection technology meets both measurement and inspection needs for Yingwei, not only bringing more benefits to future probe testing but also introducing an innovative axis in AI technology.
Change the method of human inspection, enhance work efficiency and product quality!
After combining both hardware (line scan) and software (AI model training) approaches, we successfully ventured into new AOI detection applications. Following the AI implementation POC, including the development and validation of a customized line scan module and an initial AI model, the plan is to officially develop the AOI machine next year and integrate it into the IC test seat production line.
Future Prospects
Probe manufacturers upstream and downstream IC factory users both have needs for the AOI inspection machine; upstream can ensure probe quality before leaving the factory, while downstream users can use this machine to regularly inspect the condition of numerous IC test seats in hand. Given the future demands, the AOI machine is poised to have a significant positive impact on the IC testing industry in the foreseeable future.
「Translated content is generated by ChatGPT and is for reference only. Translation date：2024-12-12」
The AI HUB website uses cookies and similar technologies to provide the best website experience, including personalized services, advertising and traffic analysis. These cookies include targeted media cookies and advanced analytics cookies. By clicking "Accept", you agree to our use of cookies. You can change your cookie preferences by clicking the "Change Cookie Settings" button. For detailed information on the cookies we use, please see our Cookie Policy.
